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Observation and analysis of SiC wafer

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Technical parameters:

1、Max resolution: 370nm 

2、Apochromatic aberration optical path, the overall optical path supports a large platform microscope with a field of view diameter of 25mm

3、Observation methods: bright field, dark field, polarization, interference, oblique illumination

4、Loading platform: size 245 * 245mm, moving range 202 * 202mm

5、Sample size: diameter ≤ 150mm

6、Objective magnification: 5X 10X 20X 50X 100X

 

Please contact Manager Wu from the sales department for more details (phone number:15225822566)